The MF6900A Fading Simulator connects via a dedicated digital interface to the MD8430A Signalling Tester to configure a simple LTE base station test system for simulating 3GPP LTE 2x2 MIMO fading.

The MF6900A uses fully digital baseband processing to assure fading processing with high reproducibility at the same settings while greatly simplifying difficult MIMO power control and achieving high accuracy. Complete elimination of analog circuits assures excellent maintainability by removing the need for periodic calibration.

One MF6900A unit supports LTE 2-cell 2x2 MIMO tests, and combination with the MD8430A Signalling Tester with LTE support makes it easy to configure an LTE 2x2 MIMO system for handover tests

• High reproducibility and maintainability due to full digital baseband processing

• All-in-one LTE 2x2 MIMO 2-cell and LTE 2x2 MIMO, W-CDMA/HSDPA handover tests

• Easy fading settings using dedicated interface with MD8430A/MD8480C

• Highly extendible hardware platform